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English(EN) LAUDE: LLM-Assisted Unit Test Generation and Debugging of Hardware DEsigns

LLM辅助框架提升硬件设计测试与调试效率

作者 PulseAugur 编辑部 · [1 个来源] ·

研究人员开发了LAUDE框架，该框架利用大型语言模型（LLMs）辅助生成单元测试和调试硬件设计。通过将LLMs的链式思考推理与设计执行信息相结合，LAUDE旨在提高测试生成的准确性和调试的效率。在VerilogEval数据集的有缺陷硬件设计代码上进行应用，LAUDE成功检测出多达100%组合逻辑设计的缺陷，并调试了其中高达93%的设计。 AI

影响 该框架有望通过自动化测试生成和调试来简化硬件开发流程，从而缩短设计周期并提高硬件可靠性。

排序理由 该集群包含一篇详细介绍用于硬件设计测试和调试的新框架的研究论文。[lever_c_demoted from research: ic=1 ai=1.0]

在 arXiv cs.AI 阅读 →

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LLM辅助框架提升硬件设计测试与调试效率

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该集群包含一篇详细介绍用于硬件设计测试和调试的新框架的研究论文。[lever_c_demoted from research: ic=1 ai=1.0]
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报道来源 [1]

  1. arXiv cs.AI TIER_1 English(EN) · Deeksha Nandal, Riccardo Revalor, Soham Dan, Debjit Pal ·

    LAUDE：LLM辅助的硬件设计单元测试生成与调试

    arXiv:2601.08856v3 Announce Type: replace-cross Abstract: Unit tests are critical in the hardware design lifecycle to ensure that component design modules are functionally correct and conform to the specification before they are integrated at the system level. Thus developing uni…

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