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English(EN) SynSur: An end-to-end generative pipeline for synthetic industrial surface defect generation and detection

新管线生成合成工业缺陷以扩充稀缺的真实世界数据

研究人员开发了 SynSur,一个用于生成合成工业表面缺陷的端到端管线,以解决缺陷检测中标记数据稀缺的问题。该管线结合了视觉语言模型、LoRA 适配的扩散模型和掩码引导的图像修复技术,以创建逼真的缺陷样本。实验表明,虽然合成数据本身不能替代真实数据,但当与现有数据集结合使用时,可以提高性能,尤其是在改进训练方案和跨域迁移方面。 AI

影响 通过用逼真的合成样本扩充稀缺的真实世界数据集,增强了工业缺陷检测能力。

排序理由 该集群描述了一篇学术论文,详细介绍了一种新的合成数据生成方法。

在 arXiv cs.CV 阅读 →

AI 生成摘要 · Google Gemini · 来自 3 个来源。 我们如何撰写摘要 →

新管线生成合成工业缺陷以扩充稀缺的真实世界数据

报道来源 [3]

  1. Hugging Face Daily Papers TIER_1 English(EN) ·

    SynSur: An end-to-end generative pipeline for synthetic industrial surface defect generation and detection

    The bottleneck in learning-based industrial defect detection is often limited not by model capacity, but by the scarcity of labeled defect data: defects are rare, annotations are expensive, and collecting balanced training sets is slow. We present an end-to-end pipeline for synth…

  2. arXiv cs.CV TIER_1 English(EN) · Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha ·

    SynSur: An end-to-end generative pipeline for synthetic industrial surface defect generation and detection

    arXiv:2604.26633v1 Announce Type: new Abstract: The bottleneck in learning-based industrial defect detection is often limited not by model capacity, but by the scarcity of labeled defect data: defects are rare, annotations are expensive, and collecting balanced training sets is s…

  3. arXiv cs.CV TIER_1 English(EN) · Saptarshi Neil Sinha ·

    SynSur: An end-to-end generative pipeline for synthetic industrial surface defect generation and detection

    The bottleneck in learning-based industrial defect detection is often limited not by model capacity, but by the scarcity of labeled defect data: defects are rare, annotations are expensive, and collecting balanced training sets is slow. We present an end-to-end pipeline for synth…