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English(EN) Nonadaptive One-Sided Testing of Binary Rank

新研究详细介绍了二元秩的非自适应单侧检验

一篇新的研究论文介绍了一种测试二元矩阵二元秩的方法。所提出的测试器利用大约 O(d^4/epsilon^2) 的查询,这与矩阵维度无关。这项工作还为这类测试建立了大约 Omega(d^{3/2}/epsilon) 的一般下界。 AI

排序理由 该条目是发表在 arXiv 上的研究论文,详细介绍了二元秩测试的新算法。[lever_c_demoted from research: ic=1 ai=0.1]

在 arXiv cs.LG 阅读 →

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新研究详细介绍了二元秩的非自适应单侧检验

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该条目是发表在 arXiv 上的研究论文,详细介绍了二元秩测试的新算法。[lever_c_demoted from research: ic=1 ai=0.1]
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报道来源 [1]

  1. arXiv cs.LG TIER_1 English(EN) · Nader H. Bshouty ·

    二元秩的非自适应单侧检验

    arXiv:2611.14163v1 Announce Type: cross Abstract: The binary rank of a binary matrix is the minimum number of disjoint all-one rectangles that partition its one-entries. We study entry-query testing of binary rank at most $d$, with one-sided error and nonadaptive queries. We give…