English(EN) DEQ-Det: Dual Evidence Queries for Few-Shot Analog IC Device Detection

DEQ-Det通过双证据查询改进模拟IC器件检测

作者 PulseAugur 编辑部 · [1 个来源] · 2026-11-06 05:00

研究人员开发了DEQ-Det，一种检测布局图像中模拟集成电路（IC）器件的新颖方法，即使在标注数据有限的情况下也能实现。该方法从相同的支持图像构建互补的前景和背景参考，捕捉目标形态和周围布局模式。DEQ-Det结合外观和布局上下文以提高检测精度，在与现有基线相比的未见器件类别上取得了卓越的性能。 AI

排序理由该集群包含一篇学术论文，详细介绍了用于特定计算机视觉任务的新方法。[lever_c_demoted from research: ic=1 ai=1.0]

在 arXiv cs.CV 阅读 →

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arXiv cs.CV TIER_1 English(EN) · Zidong Zhao, Rong Huang, Chengxing Fan, Jie Hu, Malik Haris, Ghazal A. Fahmy, Morteza Mousazadeh, Guoqiang Zhang · 2026-11-06 05:00

DEQ-Det：用于少样本模拟IC器件检测的双证据查询

arXiv:2611.07682v1 Announce Type: new Abstract: Detecting analog integrated circuit (IC) devices in layout images supports circuit analysis and inspection. With only a few annotated examples, variation in device geometry and visual similarity to dummy or routing structures make r…

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DEQ-Det：用于少样本模拟IC器件检测的双证据查询

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