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English(EN) MicroSD card torture test writes 133 petabytes of data across 351 cards over three years — cards tested to failure reveal SanDisk as the outlier with 6 failures of the 7 tested

MicroSD 卡残酷测试显示 SanDisk 因高故障率而成为异常值

作者 PulseAugur 编辑部 · [1 个来源] ·

一项为期三年的、涉及 351 张 microSD 卡的耐久性测试揭示了不同品牌之间显著的性能差异。科技爱好者 Matt Cole 的这项大型项目，将卡片置于极端条件下并写入了 133 PB 数据，发现 PNY、Kingston、Delkin Devices、Lexar 和 Samsung 等品牌的消费级卡表现良好。值得注意的是，Amazon Basics 卡至今未出现故障，尽管由于其通用性质未被正式排名。SanDisk 的故障率高于其他测试品牌，成为异常值。 AI

排序理由 该条目详细介绍了消费品长期独立耐久性测试的结果，类似于一项研究。[lever_c_从研究降级：ic=1 ai=0.1]

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MicroSD 卡残酷测试显示 SanDisk 因高故障率而成为异常值

本文如何被排名

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Tool
该条目详细介绍了消费品长期独立耐久性测试的结果，类似于一项研究。[lever_c_从研究降级：ic=1 ai=0.1]
Source corroboration
Single-source cluster
Only one publisher covered this so far. Single-source stories can still rank when the publisher is high-authority, but they lack cross-source corroboration.
Topics
product, other
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AI-industry relevance
Low
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Story freshness
45 days old
Aged out of breaking-news scoring windows; ranking reflects the durable signal from the full source set.

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报道来源 [1]

  1. Tom's Hardware TIER_1 English(EN) · Jowi Morales ·

    MicroSD卡残酷测试三年写入133 PB数据，共计351张卡——测试至损坏的卡显示SanDisk表现异常，7张卡中有6张损坏

    Matt Cole has been running hundreds of microSD cards through their paces, running them through thousands of cycles until they fail. The results are quite surprising, with both the winners and losers coming from some of the most unexpected brands.

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