This paper proposes a novel framework for Printed Circuit Board (PCB) defect detection using infrared (IR) imagery, addressing the challenge of limited IR data. The method employs CycleGAN for unpaired image-to-image translation to generate synthetic IR images from visible-light images, simulating thermal patterns. These synthetic images, combined with limited real IR data, are used to train a YOLOv8 detector, significantly improving performance in low-data scenarios. AI
影响 Introduces a method to overcome data scarcity in industrial inspection using generative models for synthetic data augmentation.
排序理由 This is a research paper detailing a novel application of deep learning models for defect detection. [lever_c_demoted from research: ic=1 ai=1.0]
AI 生成摘要 · Google Gemini · 来自 1 个来源。 我们如何撰写摘要 →