ENTITY Nikola Kolev Mr

Nikola Kolev Mr

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TOOL · CL_100140 · Jun 19 · 04:00

New AI method overcomes data scarcity for STM defect classification

Researchers have developed a novel approach to classify defects in scanning tunneling microscopy (STM) images by addressing the scarcity of labeled data. This method employs a combination of few-shot learning and unsupe…