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ENTITY Focused Ion Beam-Scanning Electron Microscope

Focused Ion Beam-Scanning Electron Microscope

PulseAugur coverage of Focused Ion Beam-Scanning Electron Microscope — every cluster mentioning Focused Ion Beam-Scanning Electron Microscope across labs, papers, and developer communities, ranked by signal.

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  1. TOOL · CL_15743 ·

    Diffusion models enhance limited-angle tomography reconstruction for TEM

    Researchers have developed TEMDiff, a new 3D diffusion-based framework for reconstructing 3D shapes from limited-angle electron tomography data. This method addresses the challenge of obtaining large, high-quality train…