ENTITY Advanced Multi-Layer Perceptron

Advanced Multi-Layer Perceptron

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TOOL · CL_228677 · Sep 1 · 04:00

AI model overcomes spatial overfitting for accurate defect depth measurement

Researchers have developed a novel spatio-temporal decoupling architecture to improve the accuracy of measuring subsurface delamination depth in carbon-fiber-reinforced polymers using optical pulsed thermography. This m…

AI model overcomes spatial overfitting for accurate defect depth measurement