New multitask scanning probe microscopy autonomously selects measurements

Researchers have developed a new method called multitask scanning probe microscopy that uses a Gaussian process to autonomously select the next measurement location and experimental protocol. This closed-loop workflow is implemented on an automated atomic force microscope and demonstrated on an AlScN wafer. The approach combines rapid, less perturbative imaging with slower, more detailed measurements, extending active learning in scanning probe microscopy. AI

IMPACT This research introduces advanced AI techniques for materials science, potentially accelerating discovery and characterization.

RANK_REASON The cluster contains a research paper detailing a new scientific methodology. [lever_c_demoted from research: ic=1 ai=0.7]

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• AlScN
• arXiv
• atomic force microscope
• Dual AC Resonance Tracking
• Gaussian process

• paper
• other

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