Characterizing the Fault Response of the Intel Neural Compute Stick 2 Under Single-Pulse Electromagnetic Fault Injection
Researchers have characterized the fault response of the Intel Neural Compute Stick 2 (NCS2) when subjected to electromagnetic fault injection. Their experiments revealed four distinct outcome classes, including silent data corruption and persistent degradation of accuracy, which can occur in a significant percentage of trials at specific hotspots. Notably, these faults can persist until the model is reloaded and can even be triggered on an idle device, indicating that standard integrity checks are insufficient for safety-critical edge applications. AI
IMPACT Reveals critical vulnerabilities in edge AI hardware, necessitating new mitigation strategies for safety-critical applications.